Dopant influence on dielectric losses, leakage behaviour, and resistance degradation of SrTiO3 thin films

Thin Solid Films

Volumn 305, Issue 1-2, 1997, Pages 66-73

  Hofman, W ^a,b   Hoffmann, S ^a   Waser, R ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

Conductivity; Dielectric properties; Electrical properties and measurements; Oxides

Indexed keywords

COMPOSITION EFFECTS; DIELECTRIC RELAXATION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC LOSSES; ELECTRIC RESISTANCE MEASUREMENT; IRON; LANTHANUM; LEAKAGE CURRENTS; MANGANESE; STRONTIUM COMPOUNDS; THIN FILMS;

STRONTIUM TITANATE;

DIELECTRIC FILMS;

EID: 0031210565     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09508-9     Document Type: Article

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