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Volumn 27, Issue 2, 2006, Pages 108-110

Microwave p-i-n diodes and switches based on 4H-SiC

Author keywords

Microwave switches; p i n diode; Silicon carbide

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; OPTICAL SWITCHES; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SILICON CARBIDE;

EID: 31644436952     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2005.862686     Document Type: Article
Times cited : (18)

References (6)
  • 3
    • 31644448513 scopus 로고    scopus 로고
    • "Investigation of microwave switching 4H-SiC p-i-n diodes in the 20-500 °C temperature range"
    • M. S. Boltovets, V. V. Basanets, A. V. N. Camara, V. A. Krivutsa, and K. Zekentes, "Investigation of microwave switching 4H-SiC p-i-n diodes in the 20-500 °C temperature range," Mater. Sci. Forum, vol. 483-485, pp. 997-1000, 2005.
    • (2005) Mater. Sci. Forum , vol.483-485 , pp. 997-1000
    • Boltovets, M.S.1    Basanets, V.V.2    Camara, A.V.N.3    Krivutsa, V.A.4    Zekentes, K.5
  • 4
    • 0036838409 scopus 로고    scopus 로고
    • "Study of the reactive ion etching of 6H-SiC and 4H-SiC in SF6/Ar plasmas by optical emission spectroscopy and laser interferometry"
    • N. Camara and K. Zekentes, "Study of the reactive ion etching of 6H-SiC and 4H-SiC in SF6/Ar plasmas by optical emission spectroscopy and laser interferometry," Solid State Electron., vol. 46, pp. 1959-1963, 2002.
    • (2002) Solid State Electron. , vol.46 , pp. 1959-1963
    • Camara, N.1    Zekentes, K.2
  • 5
    • 31544484087 scopus 로고    scopus 로고
    • "Method of Making an Ohmic Contact to p-Type Silicon Carbide, Comprising Titanium Carbide and Nickel Silicide"
    • Jul. 29
    • K. Vassilevski and K. Zekentes, "Method of Making an Ohmic Contact to p-Type Silicon Carbide, Comprising Titanium Carbide and Nickel Silicide," U.S. Patent 6 599 644, Jul. 29, 2003.
    • (2003) U.S. Patent 6 599 644
    • Vassilevski, K.1    Zekentes, K.2
  • 6
    • 31644443858 scopus 로고    scopus 로고
    • "Investigation of packaged microwave 4H SiC p-i-n diodes in the 20-700 °C temperature range"
    • presented at the ICSCRM, Pittsburgh, PA, Sep. 18-23
    • M. S. Boltovets, V. V. Basanets, N. Camara, V. A. Krivutsa, and K. Zekentes, "Investigation of packaged microwave 4H SiC p-i-n diodes in the 20-700 °C temperature range," presented at the ICSCRM, Pittsburgh, PA, Sep. 18-23, 2005.
    • (2005)
    • Boltovets, M.S.1    Basanets, V.V.2    Camara, N.3    Krivutsa, V.A.4    Zekentes, K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.