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Volumn 99, Issue 2, 2006, Pages
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Electromigration in Pb-free flip chip solder joints on flexible substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
BUMP METALLURGY;
CATHODE INTERFACES;
PB-FREE FLIP CHIP SOLDER JOINTS;
VOID MIGRATION;
CURRENT DENSITY;
ELECTROMIGRATION;
FLIP CHIP DEVICES;
LEAD;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
SOLDERED JOINTS;
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EID: 31644434548
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2163982 Document Type: Article |
Times cited : (38)
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References (16)
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