The effect of various parameters on the structure of W-Ti thin films

Materials Science Forum

Volumn 453-454, Issue , 2004, Pages 55-60

  Petrovic S ^a   Gakovic B ^a   Rakocevic Z ^a   Nenadovic T ^a  

^a UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

STM; Thin Films; Tungsten Titanium Alloy; XRD

Indexed keywords

CRYSTAL LATTICES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SPUTTERING; TITANIUM ALLOYS; X RAY DIFFRACTION;

DIFFUSION BARRIERS; OXIDANT RESISTANCE; STM;

THIN FILMS;

EID: 3142713843     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.453-454.55     Document Type: Conference Paper

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