Optical properties of low-dimensional semiconductor systems fabricated by cleaved edge overgrowth

Physica Status Solidi C: Conferences

Volumn 1, Issue 8, 2004, Pages 2028-2055

  Schuster, R ^a   Hajak, H ^a   Reinwald, M ^a   Wegscheider, W ^a   Schedelbeck, G ^b   Sedlmaier, S ^b   Stopa, M ^b,c   Birner, S ^b   Vogl, P ^b   Bauer, J ^b   Schuh, D ^b   Bechler, M ^b   Abstreiter, G ^b  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HYDROSTATIC PRESSURE; LASER BEAM EFFECTS; MOLECULAR BEAM EPITAXY; OPTICAL PROPERTIES; PARAMETER ESTIMATION; PHOTOLUMINESCENCE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM DOTS; WIRE;

MULTILAYER SYSTEMS; QUANTUM ERRORS; QUANTUM WELL; REGROWTH;

SEMICONDUCTOR DEVICES;

EID: 3142659493     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200404762     Document Type: Review

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