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Volumn 17, Issue 4, 2004, Pages 475-482
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Design and development of novel monomers and copolymers for 193-nm lithography
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Author keywords
193 nm lithography; CN group; Copolymer; Monomer; Resist material
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Indexed keywords
ACRYLIC ACID;
COPOLYMER;
MONOMER;
NITRILE;
ARGON FLUORIDE LITHOGRAPHY;
ARTICLE;
CALCULATION;
MATERIALS;
POLYMERIZATION;
SYNTHESIS;
TECHNOLOGY;
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EID: 3142654228
PISSN: 09149244
EISSN: None
Source Type: Journal
DOI: 10.2494/photopolymer.17.475 Document Type: Article |
Times cited : (5)
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References (13)
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