Chapter 6 Electronic Properties and Deep Levels in Germanium-Silicon

Semiconductors and Semimetals

Volumn 56, Issue C, 1998, Pages 293-346

  Ringel, Steven A ^a   Grillot, Patrick N ^b  

^a Ohio State University   (United States)

^b Hewlett Packard Optoelectronics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; GERMANIUM;

DEEP-LEVELS;

SILICON;

EID: 3142600768     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)62584-3     Document Type: Chapter

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