Structural, electronic, and luminescence investigation of strain-relaxation induced electrical conductivity type conversion in GeSi/Si heterostructures

Journal of Applied Physics

Volumn 80, Issue 5, 1996, Pages 2823-2832

  Grillot, P N ^a   Ringel, S A ^a   Michel, J ^b   Fitzgerald, E A ^b  

^a The Ohio State University   (United States)

^b USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010481371     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363200     Document Type: Article

References (36)

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