Structure and morphology of the As-rich and the stoichiometric GaAs(114)A surface

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 7645-7654

  Marquez J ^a   Kratzer, P ^a   Jacobi, K ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL BONDS; COMPUTER SIMULATION; DIMERS; ELECTRONIC STRUCTURE; ELECTRONS; FREE ENERGY; INTERFACIAL ENERGY; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; STOICHIOMETRY;

CHEMICAL POTENTIAL; LATTICE MISMATCH; SURFACE FREE ENERGY; SURFACE RECONSTRUCTIONS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 3142529263     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1707212     Document Type: Article

References (28)

1. S. Shimomura, A. Wakejima, A. Adachi, Y. Okamoto, N. Sano, K. Murase, and S. Hiyamizu, Jpn. J. Appl. Phys., Part 1 32, L1728 (1993).
2. S. Hiyamizu, S. Shimomura, A. Wakejima, S. Kaneko, A. Adachi, Y. Okamoto, N. Sano, and K. Murase, J. Vac. Sci. Technol. B 12, 1043 (1994).
3. S. Shimomura, K. Shinohara, T. Kitada, S. Hiyamizu, Y. Tsuda, N. Sano, A. Adachi, and Y. Okamoto, J. Vac. Sci. Technol. B 13, 696 (1995).
4. S. Shimomura, S. Kaneko, T. Motokawa, K. Shinohara, A. Adachi, Y. Okamoto, N. Nano, K. Murase, and S. Hiyamizu, J. Cryst. Growth 150, 409 (1995).
5. Y. Hanamaki, T. Takeuchi, N. Ogasawara, and Y. Shiraki, J. Cryst. Growth 175/176, 359 (1997).
6. B. A. Joyce, T. S. Jones, and J. G. Belk, J. Vac. Sci. Technol. B 16, 2373 (1998).
7. J. Márquez, P. Kratzer, L. Geelhaar, K. Jacobi, and M. Scheffler, Phys. Rev. Lett. 86, 115 (2001).
8. S. C. Erwin, A. A. Baski, and L. J. Whitman, Phys. Rev. Lett. 77, 687 (1996).
9. W. A. Harrison, J. Vac. Sci. Technol. 16, 1492 (1979).
10. M. D. Pashley, Phys. Rev. B 40, 10481 (1989).
11. Y. Tsuda, S. Shimomura, S. Hiyamizu, and N. Sano, J. Cryst. Growth 150, 415 (1995).
12. T. Yamada, H. Yamaguchi, and Y. Horikoshi, J. Cryst. Growth 150, 421 (1995).
13. J. Platen, C. Setzer, W. Ranke, and K. Jacobi, Appl. Surf. Sci. 123/124, 43 (1998).
14. H. Yamaguchi, T. Yamada, and Y. Horikoshi, Jpn. J. Appl. Phys., Part 1 34, L1490 (1995).
15. P. Geng, J. Marquez, L. Geelhaar, J. Platen, C. Setzer, and K. Jacobi, Rev. Sci. Instrum. 71, 504 (2000).
16. M. Bockstedte, A. Kley, J. Neugebauer, and M. Scheffler, Comput. Phys. Commun. 107, 187 (1997).
17. M. Fuchs and M. Scheffler, Comput. Phys. Commun. 116, 67 (1999).
18. J. P. Perdew and A. Zunger, Phys. Rev. B 23, 5048 (1981).
19. K. Shiraishi, J. Phys. Soc. Jpn. 10, 3455 (1990).
20. H. J. Monkhorst and J. D. Pack, Phys. Rev. B 13, 5188 (1976).
21. J. Tersoff and D. R. Hamann, Phys. Rev. B 31, 805 (1985).
22. N. Moll, A. Kley, E. Pehlke, and M. Scheffler, Phys. Rev. B 54, 8844 (1996).
23. The known stable (8 × 1) reconstruction of (113) [see, M. Wassermeier, J. Sudijono, M. D. Johnson, K. T. Leung, B. G. Orr, L. Däweritz, and K. Ploog, Phys. Rev. B 51, 14721 (1995)] does not develop, probably due to the small size of the microfacet.
24. H. Yamaguchi and Y. Horikoshi, Jpn. J. Appl. Phys., Part 1 33, L1423 (1994).
25. W. G. Schmidt, S. Mirbt, and F. Bechstedt, Phys. Rev. B 62, 8087 (2000).
26. C. Ratsch, W. Barvosa-Carter, F. Grosse, J. H. G. Owen, and J. J. Zinck, Phys. Rev. B 62, R7719 (2000).
27. R. H. Miwa and G. P. Srivastava, Phys. Rev. B 62, 15778 (2000).
28. M. C. Xu, Y. Temko, T. Suzuki, and K. Jacobi, Appl. Phys. Lett. 84, 2283 (2004).