An embedded autonomous scan-based results analyzer (EARA) for SoC cores

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 293-298

  Nahvi, M ^a   Ivanov, A ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

Testing; Very large scale integration

Indexed keywords

INTEGRATION TESTING; PROGRAMMABLE LOGIC CONTROLLERS; TESTING; VLSI CIRCUITS;

EMBEDDED BLOCKS; ON CHIPS; SCAN TESTS; SCAN-BASED TESTING; SOC DESIGNS; TEST DATA;

SYSTEM-ON-CHIP;

EID: 3142512933     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197666     Document Type: Conference Paper

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