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Volumn 45, Issue 2, 2006, Pages 271-280

Two-wave-plate compensator method for full-field retardation measurements

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; MEASUREMENT THEORY; MICROSCOPES; OPTICAL DEVICES; POLARIZATION;

EID: 31344473735     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.000271     Document Type: Article
Times cited : (26)

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