Measurement of low-level strain birefringence in optical elements using aphotoelastic modulator

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2873, Issue , 1996, Pages 17-20

  Oakberg, Theodore C ^a  

^a Hinds Instruments Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; FUSED SILICA; OPTICAL SIGNAL PROCESSING; POLARIZATION;

MEASURED VALUES; MEASUREMENTS OF; PHOTOELASTIC MODULATOR; STRAIN BIREFRINGENCE;

LIGHT MODULATORS;

EID: 0040611181     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.246208     Document Type: Conference Paper

References (5)

1. J. C. Kemp, "Polarized light and its interaction with modulation devices, " Hinds Instruments, Inc., Hillsboro, OR, 1987.
2. T. C. Oakberg, "Modulated interference effects: use of photoelastic modulators with lasers, " Optical Engineering, 34, 6, pp. 1545-1550, 1995.
3. P. Schermerhorn, Corning Incorporated, Corning, NY, private communication.
4. P. L. Frattini, "Rheo-optical studies of sheared suspensions using linear dichroism, " PhD thesis, Chemical Engineering Department, Stanford University, Sept. 1985.
5. S. J. Johnson, "Simultaneous dichroism and birefringence measurements of sheared collodial suspensions in polymeric liquids, " PhD thesis, Chemical Engineering Department, Stanford University, Feb. 1987.