An improved method for measuring low-level linear birefringence in optical materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3424, Issue , 1998, Pages 120-124

  Wang, Baoliang ^a  

^a Hinds Instruments Incorporated   (United States)

Author keywords

Induced linear birefringence; Photoelastic modulator; Polarization modulation; Residual linear birefringence

Indexed keywords

BIREFRINGENCE; LIGHT MODULATORS; LIGHT POLARIZATION; OPTICAL DEVICES; PHOTOELASTICITY; SENSITIVITY ANALYSIS; SILICA;

PHOTOELASTIC MODULATORS;

OPTICAL MATERIALS;

EID: 0037732943     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.323758     Document Type: Conference Paper

References (14)

1. J. C. Kemp, "Piezo-Optical Birefringence Modulators : New use for a Long-Known Effect," J. Opt. Sci. Amer., 59, 950-954 (1969).
2. M. Billardon and J. Badoz, "Birefringence Modulator," Compt. Rend. Acad. Bc. Paris, 262, Ser. B, 1672-1675 (1966).
3. T. C. Oakberg, "Measurement of Low-level Strain Birefringence in Optical Elements Using a Photoelastic Modulator," SPIE, 2873, 17-20 (1996).
4. T. C. Oakberg, "Measurement of Low-level Strain Birefringence in optical Materials," SPIE, 3121, 23-27 (1997).
5. J. Schellman and H. P. Jensen, "Optical Spectroscopy of Oriented Molecules," Chem. Rev. 87, 1359-1399 (1987).
6. J. C. Kemp, Basic Laboratory set-up for various measurements possible with the photoelastic modulator, Application note, Hinds Instruments, Inc. (1975).
7. For example, see D. S. Kliger, J. W. Lewis and C. E. Randall, Polarized light in optics and spectroscopy, (Academic Press, San Diego, CA, 1990), Chap. 4, pp 75-83.
8. T. C. Oakberg and B. Wang, Light Intensity Modulation Using A PEM, Application note, Hinds Instruments, Inc. (1995).
9. S. J. Johnson, "Simultaneous dichroism and birefringence measurements of sheared colloidal suspension in polymeric liquids," Ph. D thesis, Stanford Univ. (1985).
10. S. N. Jasperson and S. E. Schnatterly, "An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique," Rev. Sci. Instrum. 40, 761-767 (1969); Errata 41, 152 (1970).
11. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light, (North-Holland, Amsterdam, 1987), pp 260-262, 415-416.
12. G. E. Jellison, Jr. and F. A. Modine, "Two-channel Polarization Modulation Ellipsometry," Appl. Opt. 29, 959-974 and references within.
13. G. E. Jellison, Jr. and F. A. Modine, "Two Modulator Generalized Ellipsometry: Theory," Appl. Opt. 36, 8190-8198 and references within.
14. G. E. Jellison, Jr. and F. A. Modine, "Two Modulator Generalized Ellipsometry: Experiment and Calibration," Appl. Opt. 36, 8184-8189.