New and improved BIST diagnosis methods from combinatorial group testing theory

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 25, Issue 2, 2006, Pages 305-315

  Kahng, Andrew B ^a,b,c   Reda, Sherief ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Fault detection; Testing; VLSI BIST diagnosis

Indexed keywords

ABSTRACT MODELS; DIGITAL LOGIC SYSTEMS; FAULT DETECTION; VLSI BIST DIAGNOSIS;

ALGORITHMS; COMBINATORIAL MATHEMATICS; ERROR DETECTION; MATHEMATICAL MODELS; VECTORS;

BUILT-IN SELF TEST;

EID: 31344454846     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2005.855940     Document Type: Article

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