Structure of MgO/V/MgO(0 0 1) thin films studied by the combination of X-ray photoemission and ion beam analysis techniques

Surface Science

Volumn 600, Issue 2, 2006, Pages 497-506

  Roman E ^a   Huttel, Y ^a   Lopez M F ^a   Gago, R ^b   Climent Font, A ^b   Munoz Martin A ^b   Cebollada, A ^c  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^c INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

ERDA; Multilayers; RBS; Vanadium; X ray photoelectron spectroscopy

Indexed keywords

EPITAXIAL GROWTH; HETEROJUNCTIONS; MAGNESIUM COMPOUNDS; MULTILAYERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; VANADIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRIC RECOIL DETECTION ANALYSIS; ERDA; RBS;

THIN FILMS;

EID: 31344438394     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.11.001     Document Type: Article

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