Crystal-field effects at the TiO2-SiO2 interface as observed by X-ray absorption spectroscopy

Langmuir

Volumn 16, Issue 17, 2000, Pages 7066-7069

  Soriano, L ^a   Fuentes, G G ^a   Quiros C ^a   Trigo, J F ^a   Sanz, J M ^a   Bressler, P R ^b   Gonzalez Elipe A R ^c  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b HAHN MEITNER INSTITUT   (Germany)

^c INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS MATERIALS; ELECTRONIC STRUCTURE; EVAPORATION; GRAPHITE; MONOLAYERS; OXIDATION; SILICA; SUBSTRATES; TITANIUM DIOXIDE; X RAY SPECTROSCOPY;

HIGHLY ORIENTED PYROLYTIC GRAPHITE; X RAY ABSORPTION SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 0034247511     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la000330x     Document Type: Article

References (21)

1. Espinós, J. P.; Lassaleta, G.; Caballero, A.; Fernández, A.; González-Elipe, A. R.; Stampfl, A.; Morant, C.; Sanz, J. M. Langmuir 1998, 14, 4908.
2. Lad, R. J. Surf. Rev. Lett. 1995, 2, 109.
3. Vurens, G. H.; Salmerón, M.; Somorjai, G. A. Prog. Surf. Sci. 1990, 32, 333.
4. Henrich, V. E. Prog. Surf. Sci. 1995, 50, 77.
5. Henrich, V. E.; Cox, P. A. In The Surface Science of Metal Oxides; Cambridge University Press: Cambridge, 1994; Chapter 7.
6. Noguera, C. In Physics and Chemistry at Oxide Surfaces; Cambridge University Press: Cambridge, 1996; Chapter 5.
7. Yu-Zhang, K.; Boisjolly, G.; Rivory, J.; Kilian, L.; Colliex, C. Thin Solid Films 1994, 253, 299.
8. Lassaleta, G.; Fernández, A.; Espinós, J. P.; González-Elipe, A. R. J. Phys. Chem. 1995, 99, 1484.
9. Mejías, J. A.; Jiménez, V. M.; Lassaleta, G.; Fernández, A.; Espinós, J. P.; González-Elipe, A. R. J. Phys. Chem. 1996, 100, 16255.
10. Chen, J. G. Surf. Sci. Rep. 1997, 30, 1.
11. Himpsel, F. J.; Karlsson, U. O.; McLean, A. B.; Terminello, L. J.; De Groot, F. M. F.; Abbate, M.; Fuggle, J. C.; Yarmoff, J. A.; Thole, B. T.; Sawatzky, G. A. Phys. Rev. B 1991, 43, 6899.
12. De Groot, F. M. F.; Fuggle, J. C.; Thole, B. T.; Sawatzky, G. A. Phys. Rev. B 1990, 41, 928.
13. De Groot, F. M. F.; Fuggle, J. C.; Thole, B. T.; Sawatzky, G. A. Phys. Rev. B 1990, 42, 5459.
14. BESSY User's Handbook. BESSY: Berlin, 1998.
15. Brydson, R.; Sauer, H.; Engel, W.; Thomas, J. M.; Zeitler, E.; Kosugi, N.; Kuroda, H. J. Phys.: Condens. Matter 1989, 1, 797.
16. Soriano, L.; Abbate, M.; Vogel, J.; Fuggle, J. C.; Fernández, A.; González-Elipe, A. R.; Sacchi, M.; Sanz, J. M.Surf. Sci. 1993, 290, 427.
17. Soriano, L.; Abbate, M.; Fernández, A.; González-Elipe, A. R.; Sanz, J. M. Surf. Interface Anal. 1997, 25, 804.
18. Lusvardi, V. S.; Barteau, M. A.; Chen, J. G.; Eng, J., Jr.; Teplyakov, A. V. Surf. Sci. 1998, 397, 237.
19. Soriano, L.; Abbate, M.; De Groot, F. M. F.; Alders, D.; Fuggle, J. C.; Hofmann, S.; Petersen, H.; Braun, W. Surf. Interface Anal. 1993, 20, 21.
20. Abbate, M.; Goedkoop, J. B.; De Groot, F. M. F.; Grioni, M.; Fuggle, J. C.; Hofmann, S.; Petersen, H.; Sacchi, M. Surf. Interface Anal. 1992, 18, 65.
21. Seah, M.P. In Practical Surface Analysis Vol. 1, 2nd ed.; Briggs, D., Seah, M. P., Eds.; John Wiley & Sons: Chichester, 1990.