Growth related interference effects in band edge thermometry of semiconductors

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 23, Issue 3, 2005, Pages 1247-1251

  Sacks, R N ^a   Barlett, D ^b   Taylor, C A ^b   Williams, J ^b  

^a Picometrix Inc   (United States)

^b k Space Associates Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND EDGE THERMOMETRY; INTERFERENCE EFFECT; SPECULAR REFLECTION;

HETEROJUNCTIONS; OPTICAL DEVICES; REFLECTION; SEMICONDUCTING ALUMINUM COMPOUNDS;

SEMICONDUCTOR MATERIALS;

EID: 31144475878     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1926295     Document Type: Conference Paper

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