Morphological and structural characterization of epitaxial α- Fe 2O3 (0001) deposited on Al2O3 (0001) by dc sputter deposition

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 23, Issue 5, 2005, Pages 1450-1455

  Lee, Ik Jae ^a   Kim, Jae Yong ^b   Yu, Chungjong ^a   Chang, Chang Hwan ^c   Joo, Man Kil ^c   Lee, Young Pak ^b   Hur, Tae Bong ^d   Kim, Hyung Kook ^d  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Hanyang University   (South Korea)

^c Research Institute of Industrial Science and Technology (RIST)   (South Korea)

^d Pusan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRYSTAL LATTICES; IRON OXIDES; MORPHOLOGY; SPUTTER DEPOSITION; STRAIN; X RAY DIFFRACTION ANALYSIS;

GROWTH RATE; LATTICE MISMATCH; STRUCTURAL CHARACTERIZATION;

FILM GROWTH;

EID: 31144475056     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2013321     Document Type: Article

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