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Volumn 23, Issue 5, 2005, Pages 2102-2108

Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMECHANICAL PERFORMANCE; IMAGING CONDITIONS; SIGNAL FORMATION;

EID: 31144447024     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2052714     Document Type: Article
Times cited : (40)

References (24)
  • 6
    • 13844258064 scopus 로고    scopus 로고
    • edited by B.Bhushan, H.Fuchs, and S.Hosaka (Springer, Berlin
    • Applied Scanning Probe Methods, edited by, B. Bhushan, H. Fuchs, and, S. Hosaka, (Springer, Berlin, 2004).
    • (2004) Applied Scanning Probe Methods
  • 12
    • 84858514653 scopus 로고    scopus 로고
    • SD 0.394-0.000-0.040-502, Piezo Kinetics, Bellefonte, PA 16823
    • SD 0.394-0.000-0.040-502, Piezo Kinetics, Bellefonte, PA 16823, www.piezo-kinetics.com.
  • 13
    • 33846489278 scopus 로고    scopus 로고
    • Atomic Force Acoustic Microscopy
    • edited by B.Bhushan and H.Fuchs (to be published).
    • U. Rabe, " Atomic Force Acoustic Microscopy., " in Applied Scanning Probe Methods, edited by, B. Bhushan, and, H. Fuchs, (to be published).
    • Applied Scanning Probe Methods
    • Rabe, U.1
  • 14
  • 24
    • 31144472180 scopus 로고    scopus 로고
    • Alternatively, the use of the inertia effect in high-frequency AFAM or UFM allows the effective stiffness of the cantilever to be increased.
    • Alternatively, the use of the inertia effect in high-frequency AFAM or UFM allows the effective stiffness of the cantilever to be increased.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.