Using scanning electrochemical microscopy to determine the doping level and the flatband potential of boron-doped diamond electrodes

ChemPhysChem

Volumn 7, Issue 1, 2006, Pages 89-93

  Chane Tune, Jérôme ^a   Petit, Jean Pierre ^a   Szunerits, Sabine ^a   Bouvier, Pierre ^a   Delabouglise, Didier ^a   Marcus, Bernadette ^a   Mermoux, Michel ^a  

^a LEPMI   (France)

Author keywords

Boron; Diamond; Doping; Electrochemistry; Scanning probe microscopy

Indexed keywords

BORON; DIAMONDS; DOPING (ADDITIVES); ELECTROCHEMISTRY; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

AG/AGCL; APPROACH CURVE; BORON DOPED DIAMOND ELECTRODES; DIAMOND SURFACES; DOPING LEVELS; FLAT-BAND POTENTIALS; NEW APPROACHES; SCANNING ELECTROCHEMICAL MICROSCOPY;

ELECTROCHEMICAL ELECTRODES;

EID: 31144446911     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.200500391     Document Type: Article

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