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Applied Surface Science

Volumn 252, Issue 7, 2006, Pages 2608-2614

Rapid combinatorial screening by synchrotron X-ray imaging

(2) Eba, Hiromi a Sakurai, Kenji a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Chemical shifts; Fine particles; Inorganic double oxide; Projection type X ray imaging; Synchrotron radiation; XAFS

Indexed keywords

ABSORPTION; IMAGING SYSTEMS; METAL ANALYSIS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY ANALYSIS;

CHEMICAL SHIFTS; FINE PARTICLES; INORGANIC DOUBLE OXIDE; PROJECTION-TYPE X-RAY IMAGING; XAFS;

SCREENING;

EID: 31144445528 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2005.07.077 Document Type: Conference Paper

Times cited : (7)

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