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Volumn 4, Issue 4, 2002, Pages 255-257

Application of x-ray photoelectron spectroscopy in determining the structure of solid-phase bound substrates

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE;

EID: 0040077867     PISSN: 15204766     EISSN: None     Source Type: Journal    
DOI: 10.1021/cc020002a     Document Type: Article
Times cited : (7)

References (15)
  • 11
    • 0039879209 scopus 로고    scopus 로고
    • -1, as determined by elemental analysis
    • -1, as determined by elemental analysis.
  • 13
    • 0039879210 scopus 로고    scopus 로고
    • note
    • Procedure for the cleavage of methyl-N-methylindole 3-acetate 5 from resin 4. Resin 4 (0.05 g) was swollen in THF/MeOH (4:1), and excess NaOMe was added. The mixture was agitated for 18 h, the resin was removed by filtration, and the solution was made up to 10 mL. Indole was added (as an internal standard), and an aliquot of the solution was removed and analyzed by HPLC (diode array detection). The yield is based on the loading of resin 1.
  • 14
    • 0039287322 scopus 로고    scopus 로고
    • note
    • 3SnH (40:1), and the solution was degassed with nitrogen for 10 min. The solution was photolyzed at 350 nm using a Rayonet photochemical reactor for 30 min. The resin was removed by filtration, and the solution was made up to 10 mL. Indole was added, and an aliquot of the solution was removed and analyzed by HPLC (diode array detection). The yield is based on the loading of resin 1.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.