Total-reflection X-ray fluorescence imaging

Spectrochimica acta, Part B: Atomic spectroscopy

Volumn 54, Issue 10, 1999, Pages 1497-1503

  Sakurai, Kenji ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; EMISSION SPECTROSCOPY; FLUORESCENCE; LIGHT REFLECTION; OPTICAL COLLIMATORS; OPTICAL RESOLVING POWER; PHOTONS; SPECTROMETRY; SYNCHROTRON RADIATION; X RAY SPECTROSCOPY;

TOTAL-REFLECTION X RAY FLUORESCENCE (TRXF) SPECTROMETRY;

IMAGING TECHNIQUES;

EID: 0033311868     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(99)00071-3     Document Type: Article

References (11)

1. Iida A., Noma T. Nucl. Instrum Methods. B82:1993;129.
2. Becker R.S., Golovchenco J.A., Patel J.R. Phys. Rev. Lett. 50:1983;153.
3. de Bokx P.K., Urbach H.P. Rev. Sci. Instrum. 66:1995;15.
4. Noma T., Iida A., Sakurai K. Phys. Rev B. 48:1993;17524.
5. Sakurai K., Iida A. Adv. X-ray Anal. 39:1997;695.
6. Wroblewski T., Geier S., Hessmer R., Schreck M., Rauschenbach B. Rev. Sci. Instrum. 66:1995;3560.
7. Wroblewski T. Synchroton. Radiat. News. 9:1996;14.
8. T. Wroblewski, Adv. X-ray Anal., 40 (1999) in press.
9. Yamaguchi N., Cho T., Kondoh T., Hirata M., Miyoski S., Aoki S., Maezawa H., Nomura M. Rev. Sci. Instrum. 60:1989;368.
10. Sakurai K., Uehara S., Goto S. J. Synchrotron. Rad. 5:1998;554.
11. Sakurai K., Iida A., Takahashi M., Gohshi Y. Jpn. J. Appl. Phys. 27:1988;L1768.