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Volumn 66, Issue 4, 2000, Pages 511-516

Deposition of high quality thin films using ECR plasma

Author keywords

Aluminum oxide film; Amorphous carbon film; ECR; Electron cyclotron resonance; Silicon dioxide film

Indexed keywords


EID: 31044438614     PISSN: 09120289     EISSN: None     Source Type: Journal    
DOI: 10.2493/jjspe.66.511     Document Type: Article
Times cited : (1)

References (14)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.