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Volumn 51, Issue 8-9, 2006, Pages 1423-1430
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Scanning photo-induced impedance microscopy - Resolution studies and polymer characterization
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Author keywords
Imaging; LAPS; Localized impedance; Polymers; Resolution; Two photon
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Indexed keywords
CHARGE CARRIERS;
ELECTRIC SPACE CHARGE;
ELECTROLYTES;
PHOTOCURRENTS;
POLYMERS;
SILICON;
THIN FILMS;
LAPS;
LOCALIZED IMPEDANCE;
SCANNING PHOTO-INDUCED IMPEDANCE MICROSCOPY (SPIM);
SILICON ON SAPPHIRE (SOS);
TWO-PHOTON;
MICROSCOPIC EXAMINATION;
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EID: 30744461394
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2005.02.119 Document Type: Conference Paper |
Times cited : (37)
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References (17)
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