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Applied Physics A: Materials Science and Processing

Volumn 82, Issue 4 SPEC. ISS., 2006, Pages 709-713

A comparative microstructural study of compositionally up- and down-graded (Ba,Sr)TiO3 thin films epitaxially grown on (La,Sr)CoO 3-covered MgO(100) substrates by pulsed laser deposition

(5) Zhu, X H a,c,d Chan, H L W b Choy, C L b Wong, K H b Hesse, D c

a NANJING UNIVERSITY (China)

b HONG KONG POLYTECHNIC UNIVERSITY (Hong Kong)

c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

d QUEEN'S UNIVERSITY BELFAST (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; CRYSTALLIZATION; ELECTRON DIFFRACTION; MICROSTRUCTURE; PULSED LASER DEPOSITION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE QUALITY; GRADED FILMS; UP-GRADED FILMS;

BARIUM COMPOUNDS;

EID: 30544447598 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-005-3419-6 Document Type: Article

Times cited : (5)

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