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Applied Physics A: Materials Science and Processing

Volumn 77, Issue 3-4, 2003, Pages 499-505

Preparation of epitaxial compositionally graded (Ba1-xSrx)TiO3 thin films with enhanced dielectric properties

(6) Zhu, X a,b Chan, H L W a Choy, C L a Wong, K H a Xu, J a Shi, S a

a HONG KONG POLYTECHNIC UNIVERSITY (Hong Kong)

b NANJING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; DEPOSITION; DIELECTRIC PROPERTIES; FILM GROWTH; FILM PREPARATION; INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; LASER ABLATION; PULSED LASER APPLICATIONS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINITY; DIELECTRIC THIN FILM CAPACITOR; EPITAXIAL COMPOSITIONALLY GRADED THIN FILMS; FILM SURFACE; FILM THICKNESS; PULSED LASER ABLATION;

BARIUM COMPOUNDS;

EID: 0041658963 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-002-1478-5 Document Type: Article

Times cited : (5)

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