Structural and dielectric properties of Er substituted sol-gel fabricated PbTiO3 thin films

Applied Physics A: Materials Science and Processing

Volumn 82, Issue 4 SPEC. ISS., 2006, Pages 727-731

  Yakovlev, S ^a   Solterbeck, C H ^a   Skou, E ^b   Es Souni, M ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); ERBIUM; GRAIN SIZE AND SHAPE; RAMAN SPECTROSCOPY; SOL-GELS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CURIE TEMPERATURE; DIELECTRIC MEASUREMENTS; ER SUBSTITUTED LEAD TITANATE THIN FILMS; LATTICE TETRAGONALITY; TRANSVERSE OPTICAL PHONON FREQUENCY;

DIELECTRIC PROPERTIES OF SOLIDS;

EID: 30444451328     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-005-3444-5     Document Type: Article

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