|
|
Volumn 36, Issue 15, 2001, Pages 2563-2575
|
|
On the crystallization kinetics of solution deposited PZT thin films
|
|
Author keywords
A. Thin films; B. Chemical solution deposition; C. Electron microscopy; C. X ray diffraction; D. Dielectric properties; D. Microstructure
|
|
Indexed keywords
ACTIVATION ENERGY;
CRYSTALLIZATION;
ELECTRON MICROSCOPY;
HIGH TEMPERATURE EFFECTS;
MICROSTRUCTURE;
PERMITTIVITY;
X RAY DIFFRACTION ANALYSIS;
AVRAMI ANALYSIS;
FERROELECTRIC THIN FILMS;
|
|
EID: 0035576428
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/S0025-5408(01)00753-X Document Type: Article |
|
Times cited : (29)
|
|
References (15)
|
