Development and trial measurement of synchrotron-radiation-light- illuminated scanning tunneling microscope

Review of Scientific Instruments

Volumn 75, Issue 6, 2004, Pages 2149-2153

  Matsushima, Takeshi ^a   Okuda, Taichi ^a   Eguchi, Toyoaki ^a   Ono, Masanori ^a   Harasawa, Ayumi ^a   Wakita, Takanori ^a,b   Kataoka, Akira ^a   Hamada, Masayuki ^a   Kamoshida, Atsushi ^a   Hasegawa, Yukio ^a   Kinoshita, Toyohiko ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JASRI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTRIC CONDUCTANCE; MATHEMATICAL MODELS; SECONDARY ION MASS SPECTROMETRY; SIGNAL PROCESSING; SURFACE STRUCTURE; SYNCHROTRON RADIATION;

ATOMIC RESOLUTION; ELEMENT SPECIFIC MICROSCOPES; PHOTOCARRIERS;

SCANNING TUNNELING MICROSCOPY;

EID: 3042858684     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1710708     Document Type: Article

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