Detection of X-ray induced current using a scanning tunneling microscope and its spatial mapping for elemental analysis

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 11 PART A, 1998, Pages

  Tsuji, Kouichi ^a   Hasegawa, Yukio ^a   Wagatsuma, Kazuaki ^a   Sakurai, Toshio ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Copper; Elemental analysis; Gold; Photoemission; Scanning tunneling microscope; Silicon; X ray

Indexed keywords

COPPER; GOLD; INDUCED CURRENTS; PHOTOEMISSION; SILICON;

ELEMENTAL ANALYSIS;

SCANNING TUNNELING MICROSCOPY;

EID: 0032207874     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l1271     Document Type: Article

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