X-ray source combined ultrahigh-vacuum scanning tunneling microscopy for elemental analysis

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 6, 2000, Pages 2676-2680

  Hasegawa, Y ^a,b   Tsuji, K ^a   Nakayama, K ^a   Wagatsuma, K ^a   Sakurai, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IRRADIATION; PHOTOCURRENTS; VACUUM APPLICATIONS; X RAY APPARATUS;

BIASING VOLTAGE;

SCANNING TUNNELING MICROSCOPY;

EID: 0034317820     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1318189     Document Type: Article

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