X-ray studies of the growth of smooth Ag films on Ge(111)-c(2×8)

Applied Physics Letters

Volumn 84, Issue 24, 2004, Pages 4995-4997

  Basile, L ^a   Hong, Hawoong ^a   Czoschke, P ^a   Chiang, T C ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EFFECTS; FILM THICKNESS; LATTICE MISMATCH; REFLECTIVITY MEASUREMENTS;

ANNEALING; CHEMICAL MODIFICATION; DEPOSITION; FILM GROWTH; GERMANIUM; MONOLAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING GALLIUM ARSENIDE; SILVER; SYNCHROTRON RADIATION;

METALLIC FILMS;

EID: 3042815771     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1763212     Document Type: Article

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