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Volumn , Issue , 2004, Pages 77-80

Ultra-thin multilayer nanomembranes for short wavelength deformable optics

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE OPTICS; CHARACTERIZATION; DEFORMATION; ETCHING; FABRICATION; FLIP CHIP DEVICES; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SPECTRUM ANALYSIS; THICKNESS CONTROL; THIN FILMS;

EID: 3042700089     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (13)
  • 1
    • 0033138343 scopus 로고    scopus 로고
    • Technology and applications of micromachined adaptive mirrors
    • G. Vdovin, P.M. Sarro, and S. Middelhoek, "Technology and Applications of Micromachined Adaptive Mirrors," in J. Micromech. Microeng., vol.9, pp. R8-R20, 1999.
    • (1999) J. Micromech. Microeng. , vol.9
    • Vdovin, G.1    Sarro, P.M.2    Middelhoek, S.3
  • 2
    • 0030245947 scopus 로고    scopus 로고
    • Computation of static shapes and voltages for micromachined deformable mirrors with nonlinear electrostatic actuators
    • P.K.C. Wang, and F.Y. Hadaegh, "Computation of Static Shapes and Voltages for Micromachined Deformable Mirrors with Nonlinear Electrostatic Actuators," in J. Microelectromech. Syst., vol. 5, pp. 205-219, 1996.
    • (1996) J. Microelectromech. Syst. , vol.5 , pp. 205-219
    • Wang, P.K.C.1    Hadaegh, F.Y.2
  • 5
    • 0030218562 scopus 로고    scopus 로고
    • Surface chemistry for atomic layer growth
    • S. M. George, A. W. Ott and J. W. Klaus, "Surface Chemistry for Atomic Layer Growth," J. Phys.Chem., Vol. 100, pp.13121-1313, 1996.
    • (1996) J. Phys.Chem. , vol.100 , pp. 13121-21313
    • George, S.M.1    Ott, A.W.2    Klaus, J.W.3
  • 7
    • 0036685058 scopus 로고    scopus 로고
    • Viscous flow reactor with quartz crystal microbalance for thin film growth by atomic layer deposition
    • J. W. Elam, M. D. Groner, and S. M. George, "Viscous flow reactor with quartz crystal microbalance for thin film growth by atomic layer deposition", Rev. Sci. Instr., vol. 73, pp. 2981-2987, 2002.
    • (2002) Rev. Sci. Instr. , vol.73 , pp. 2981-2987
    • Elam, J.W.1    Groner, M.D.2    George, S.M.3
  • 12
    • 0002310405 scopus 로고
    • ed. by C.A. Neugebaur, J.B. Newkirk, and D.A. Vermilyea, Wiley and Sons, New York
    • J.W. Beams, Structure and Properties of Thin Films, ed. by C.A. Neugebaur, J.B. Newkirk, and D.A. Vermilyea, Wiley and Sons, New York, 1959, pp. 183-182.
    • (1959) Structure and Properties of Thin Films , pp. 183-1182
    • Beams, J.W.1
  • 13
    • 0033348116 scopus 로고    scopus 로고
    • A series solution approach to an analytical load deflection relation for the measurement of mechanical properties of thin films
    • C.T. Loy, S.C. Pradhan, T.Y. Ny, and K.Y. Lam, "A Series Solution Approach to an Analytical Load Deflection Relation for the Measurement of Mechanical Properties of Thin Films," in J. Micromech. Microeng., vol. 9, pp. 341-344, 1999.
    • (1999) In J. Micromech. Microeng. , vol.9 , pp. 341-344
    • Loy, C.T.1    Pradhan, S.C.2    Ny, T.Y.3    Lam, K.Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.