Analysis of dynamic impatt oscillations caused by radiation induced deep centres with local and homogeneous vertical distribution

IEE Proceedings: Circuits, Devices and Systems

Volumn 151, Issue 3, 2004, Pages 219-224

  Siemieniec, R ^a   Lutz, J ^b   Herzer, R ^c  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^c Semikron Elektronik GmbH AndCo KG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT OSCILLATIONS; COMPUTER SIMULATION; ESTIMATION; IRRADIATION; SEMICONDUCTOR DEVICE MANUFACTURE; TEMPERATURE;

CHARGED DEEP DONOR; IMPATT OSCILLATIONS;

BIPOLAR SEMICONDUCTOR DEVICES;

EID: 3042568999     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20040451     Document Type: Article

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