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Volumn 5, Issue 4, 2004, Pages 431-435

Self-organized one-axis-oriented PZT films with nano-domain structure

Author keywords

Metal organic chemical vapor deposition; PZT; Self organized

Indexed keywords

CRYSTALS; DIELECTRIC MATERIALS; FLUORESCENCE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; PIEZOELECTRICITY; SINTERING; STRAIN; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 3042538741     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.stam.2004.02.004     Document Type: Article
Times cited : (4)

References (13)
  • 1
    • 0038568013 scopus 로고    scopus 로고
    • N. Setter. Switzerland: EPFL Swiss Federal Institute of Technology
    • Setter N. Setter N. Piezoelectric Materials in Devices. 2002;EPFL Swiss Federal Institute of Technology, Switzerland.
    • (2002) Piezoelectric Materials in Devices
    • Setter, N.1
  • 2
    • 0000200977 scopus 로고    scopus 로고
    • 3 thin films prepared by metal-organic chemical vapor deposition: Systematic compositional variation of electrical and optical properties
    • 3 thin films prepared by metal-organic chemical vapor deposition: systematic compositional variation of electrical and optical properties. J. Appl. Phys. 81:1997;2349-2357.
    • (1997) J. Appl. Phys. , vol.81 , pp. 2349-2357
    • Foster, C.1    Bai, G.2    Csencsits, R.3    Vetrone, J.4    Jammy, R.5    Wills, L.6    Carr, E.7    Amano, J.8
  • 3
    • 0037417284 scopus 로고    scopus 로고
    • Critical thickness for ferroelectricity in perovskite ultrathin films
    • Junquera J., Ghosez P. Critical thickness for ferroelectricity in perovskite ultrathin films. Nature. (London) 422:2003;506-508.
    • (2003) Nature (London) , vol.422 , pp. 506-508
    • Junquera, J.1    Ghosez, P.2
  • 5
    • 0348095063 scopus 로고    scopus 로고
    • 3 thick films on (100)Si substrates by metalorganic chemical vapor deposition and their electrical properties
    • 3 thick films on (100)Si substrates by metalorganic chemical vapor deposition and their electrical properties. Jpn. J. Appl. Phys. 41:2003;6705-6708.
    • (2003) Jpn. J. Appl. Phys. , vol.41 , pp. 6705-6708
    • Yokoyama, S.1    Ozeki, T.2    Oikawa, T.3    Funakubo, H.4
  • 6
    • 3042534137 scopus 로고    scopus 로고
    • 3 films grown on polycrystalline substrates by metalorganic chemical vapor deposition
    • in press
    • 3 films grown on polycrystalline substrates by metalorganic chemical vapor deposition. Integ. Ferro. 2004;. in press.
    • (2004) Integ. Ferro.
    • Yokyama, S.1    Ozeki, T.2    Oikawa, T.3    Funakubo, H.4
  • 7
    • 0036467217 scopus 로고    scopus 로고
    • 3 thin films with different orientations as the bottom electrode for epitaxial ferroelectric thin film
    • 3 thin films with different orientations as the bottom electrode for epitaxial ferroelectric thin film. J. Cryst. Growth. 235:2002;401-406.
    • (2002) J. Cryst. Growth , vol.235 , pp. 401-406
    • Funakubo, H.1    Oikawa, T.2    Higashi, N.3    Saito, K.4
  • 8
    • 0037734820 scopus 로고    scopus 로고
    • Evaluation of longitudinal displacement for lead zirconium titanium films
    • Iijima T., Ito S., Matsuda H. Evaluation of longitudinal displacement for lead zirconium titanium films. Jpn. J. Appl. Phys. 41:2002;6735-6738.
    • (2002) Jpn. J. Appl. Phys. , vol.41 , pp. 6735-6738
    • Iijima, T.1    Ito, S.2    Matsuda, H.3
  • 10
    • 0035359163 scopus 로고    scopus 로고
    • 3 thin films by source gas pulse-introduced metalorganic chemical vapor deposition
    • 3 thin films by source gas pulse-introduced metalorganic chemical vapor deposition. Jpn. J. Appl. Phys. 40:2001;4126-4130.
    • (2001) Jpn. J. Appl. Phys. , vol.40 , pp. 4126-4130
    • Aratani, M.1    Nagashima, K.2    Funakubo, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.