Diagnosis of scan-chains by use of a configurable signature register and error-correcting codes

Proceedings - Design, Automation and Test in Europe Conference and Exhibition

Volumn 2, Issue , 2004, Pages 1302-1307

  Leininger, A ^a   Goessel, M ^b   Muhmenthaler, P ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR-CORRECTING CODES; INFORMATION BITS; SCAN-CELLS; SCAN-CHAINS; DIAGNOSIS METHODS; ERROR CORRECTING CODE; ERROR-CORRECTING; INFORMATION BIT; LINEAR BLOCK CODE; NEW APPROACHES; OUTPUT SEQUENCES; SIGNATURE REGISTERS;

ERROR ANALYSIS; FEEDBACK CONTROL; FLIP FLOP CIRCUITS; SIGNAL PROCESSING; VECTORS;

INFORMATION ANALYSIS; EXHIBITIONS;

EID: 3042517125     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2004.1269075     Document Type: Conference Paper

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20. Patent pending: AK 2003P51984DE, German Patent and Trademark Office