Diffraction-suppressed high-resolution imaging through metallodielectric nanofilms

Optics Express

Volumn 14, Issue 1, 2006, Pages 216-221

  Feng, Simin ^a   Elson, J Merle ^a  

^a NAVAL AIR WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; DIFFRACTION; MULTILAYERS; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; WAVE PROPAGATION;

DIFFRACTION-SUPPRESSED PROPAGATION; METALLODIELECTRIC NANOFILMS;

IMAGING SYSTEMS;

EID: 30344458175     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.14.000216     Document Type: Article

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