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Volumn 41, Issue 2, 2006, Pages 253-259

Physical and electronic properties of ZnO:Al/porous silicon

Author keywords

A. Oxides; A. Thin films; B. Sputtering; C. Atomic force microscopy; D. Luminescence

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; SPUTTERING; THIN FILMS;

EID: 30344433442     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2005.08.018     Document Type: Article
Times cited : (28)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.