Influence of the interface structure on the bias dependence of tunneling magnetoresistance

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 18, 2005, Pages

  Heiliger, Christian ^a   Zahn, Peter ^a   Yavorsky, Bogdan Yu ^a   Mertig, Ingrid ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29644437910     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.180406     Document Type: Article

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