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Volumn 89, Issue 1, 2001, Pages 626-633

Spectral and intensity dependence of spatially resolved two-photon conductivity defects on a GaAsP photodiode

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EID: 2942747160     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1329351     Document Type: Article
Times cited : (4)

References (29)
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    • 0031189645 scopus 로고    scopus 로고
    • Q. Xu, M. H. Gray, and J. W. P. Hsu, J. Appl. Phys. 82, 748 (1997); J. W. P. Hsu, E. A. Fitzgerald, Y. H. Xie, and P. J. Silverman, ibid. 79, 7743 (1996); Appl. Phys. Lett. 65, 344 (1994).
    • (1997) J. Appl. Phys. , vol.82 , pp. 748
    • Xu, Q.1    Gray, M.H.2    Hsu, J.W.P.3
  • 13
    • 0028462261 scopus 로고
    • Q. Xu, M. H. Gray, and J. W. P. Hsu, J. Appl. Phys. 82, 748 (1997); J. W. P. Hsu, E. A. Fitzgerald, Y. H. Xie, and P. J. Silverman, ibid. 79, 7743 (1996); Appl. Phys. Lett. 65, 344 (1994).
    • (1994) Appl. Phys. Lett. , vol.65 , pp. 344
  • 14
    • 3342875538 scopus 로고    scopus 로고
    • note
    • Our use and specific mention of this product (and subsequent products) does not imply that these are the most suitable for our work or that similar products from other vendors would he less suitable.
  • 19
  • 22
    • 3342939817 scopus 로고    scopus 로고
    • Silicon MDT Ltd., silicon gratings TGZ-01, -02, -03
    • Silicon MDT Ltd., silicon gratings TGZ-01, -02, -03.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.