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Volumn 51-52, Issue , 1996, Pages 243-248
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Optical, electrical and structural studies of microcrystallized sputtered silicon
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Author keywords
Dark conductivity; Optical absorption; TEM
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Indexed keywords
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EID: 17544382880
PISSN: 10120394
EISSN: None
Source Type: Book Series
DOI: 10.4028/www.scientific.net/ssp.51-52.243 Document Type: Article |
Times cited : (3)
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References (9)
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