Temperature-dependent contact resistivity of the nonalloyed ohmic contacts to p-GaN

Journal of Applied Physics

Volumn 95, Issue 10, 2004, Pages 5917-5919

  Kwak, Joon Seop ^a   Nam, Ok Hyun ^a   Park, Yongjo ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; HEAT CONDUCTION; MAGNESIUM PRINTING PLATES; MATHEMATICAL MODELS; OHMIC CONTACTS; OPTOELECTRONIC DEVICES; SURFACE TREATMENT; THERMAL EFFECTS; THIN FILMS;

BAND GAP; DEEP-LEVEL DEFECTS (DLD); TRANSFER LENGTH METHOD (TLM); WORK FUNCTION;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 2942522889     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1691178     Document Type: Article

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