Characterization of dual-band infrared detectors for application to remote sensing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5883, Issue , 2005, Pages 1-8

  Nurul Abedin, M ^a   Refaat, Tamer F ^b   Xiao, Yegao ^c   Bhat, Ishwara ^c  

^a NASA LANGLEY RESEARCH CENTER   (United States)

^b SCIENCE AND TECHNOLOGY CORPORATION   (United States)

^c RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

Characterization; Detectivity; Detectors; Dual band; Fabrication; Infrared; Noise; Photovoltaic; Quantum efficiency; Responsivity

Indexed keywords

DETECTIVITY; DUAL-BAND; PHOTOVOLTAIC; RESPONSIVITY;

ACOUSTIC NOISE; CHARACTERIZATION; FABRICATION; INFRARED RADIATION; METALLORGANIC VAPOR PHASE EPITAXY; PHOTOVOLTAIC EFFECTS; QUANTUM EFFICIENCY; REMOTE SENSING; SPACE RESEARCH;

INFRARED DETECTORS;

EID: 29244458707     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.614938     Document Type: Conference Paper

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