Factors influencing probing accuracy of a coordinate measuring machine

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 6, 2005, Pages 2540-2548

  Woźniak, Adam ^a   Dobosz, Marek ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Coordinate measuring machine (CMM); Dimensional metrology; One stage and two stage probes; Probing accuracy

Indexed keywords

CURVE FITTING; MATHEMATICAL MODELS; PIEZOELECTRIC TRANSDUCERS; PROBES; REGRESSION ANALYSIS;

DIMENSIONAL METROLOGY; ONE-STAGE AND TWO-STAGE PROBES; PROBING ACCURACY;

COORDINATE MEASURING MACHINES;

EID: 29244456485     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.858541     Document Type: Article

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