Dynamic error characteristics of touch trigger probes fitted to coordinate measuring machines

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 5, 1998, Pages 1168-1172

  Johnson, Roland P ^b   Yang, Qingping ^a,b   Butler, Clive ^b  

^a IEEE   (United Kingdom)

^b BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

Dynamics; Error analysis; Inspection; Measurement; Position measurement; Transducers

Indexed keywords

ERROR ANALYSIS; POSITION MEASUREMENT; TRANSDUCERS;

COORDINATE MEASURING MACHINES; TOUCH TRIGGER PROBES;

PROBES;

EID: 0032179010     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.746577     Document Type: Article

References (11)

1. J. A. Bosch, Ed., Coordinate Measuring Machines and Systems. New York: Marcel-Dekker, 1995.
2. W. G. Weekers and P. H. J. Schellekens, "Assessment of dynamic errors of CMM's for fast probing," CIRP Ann. Manufact. Technol., vol. 44, no. 1, pp. 469-474, Jan. 1995.
3. Y. Mu, C. Dong, J. Guo, and G. Zhang, "Dynamic error compensation of coordinate measuring machines for fast probing," in Proc. SPIE - Int. Soc. Opt, Eng., vol. 2899, pp. 6-11, Sept. 1996.
4. C. Butler, "Investigation into the performance of probes on coordinate measuring machines," Ind. Metrol, vol. 2, no. 1, pp. 59-70, Dec. 1991.
5. Q. Yang, C. Butler, and P. Baird, "Error compensation of touch trigger probes," Measurement: J. Int. Meas. Confed., vol. 18, no. 1, pp. 47-57, May 1996.
6. E. J. Davis, W. J. Liao, G. F. Scott, and K. J. Stout, "Sources of measurement uncertainty when using coordinate measuring machines: A top-down systematic approach," in Proc. LAMDAMAP'95, Southampton, U.K., July 1995, pp. 185-201.
7. W. Tyler Estler, S. D. Phillips, B. Borchardt, T. Hopp, C. Witzgall, M. Levenson, K. Eberhardt, M. McClain, Y. Shen, and X. Zhang, "Error compensation for CMM touch trigger probes," Precision Eng., vol. 19, no. 2-3, pp. 85-97, Oct./Nov. 1996.
8. H. Haitjema, "Dynamic probe calibration in the micrometer region with nanometric accuracy," Precision Eng., vol. 19, no. 2/3, pp. 98-104, Oct./Nov. 1996.
9. H. Pahk and J. Kim, "Application of microcomputer for assessing the probe lobing error and geometric errors of CMM's using commercial ring gauges," Int. J. Adv. Manufact. Technol., vol. 10, no. 3, pp. 208-218, 1995.
10. L. Nawara and M. Kowalski, "The investigations on selected dynamical phenomena in the heads of multi-coordinate measuring devices," CIRP Ann., vol. 33, no. 1, pp. 373-375, 1984.
11. R. P. Johnson, Q. Yang, and C. Butler, "Dynamic error characteristics of touch trigger probes fitted to coordinate measuring machines when scanning," unpublished.