Local correlation of photoemission electron microscopy and STM at a defined cluster substrate system

Applied Physics A: Materials Science and Processing

Volumn 82, Issue 1 SPEC. ISS., 2006, Pages 87-93

  Rohmer, M ^a   Wiemann, C ^a   Munzinger, M ^a   Guo, L ^a   Aeschlimann, M ^a   Bauer, M ^a  

^a Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRON MICROSCOPY; IMAGE ANALYSIS; PHOTOEMISSION;

CORRELATE PROPERTIES; NANOMETERS; PHOTOEMISSION ELECTRON MICROSCOPY; SURFACE AREAS;

SUBSTRATES;

EID: 29244451589     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-005-3343-9     Document Type: Article

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