A maximum-likelihood formalism for sub-resolution axial localization of fluorescent nanoparticles

Optics Express

Volumn 13, Issue 26, 2005, Pages 10503-10522

  Aguet, François ^a   Van De Ville, Dimitri ^a   Unser, Michael ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELEMENTARY PARTICLES; FLUORESCENCE; IMAGE PROCESSING; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS;

FLUORESCENT NANOPARTICLES; NANOMETER-SCALE PRECISION; PHANTOM DATA; SUB-RESOLUTION LOCALIZATIONS;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 29244439892     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.010503     Document Type: Article

References (23)

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