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Volumn 28, Issue 5, 2006, Pages 1159-1164

Equilibrium and bifurcation of varying cross-section microcantilevers subject to the atomic force

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; BIFURCATION (MATHEMATICS); LAGRANGE MULTIPLIERS; THEOREM PROVING;

EID: 29144517808     PISSN: 09600779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chaos.2005.08.194     Document Type: Article
Times cited : (4)

References (8)
  • 1
    • 0012618901 scopus 로고
    • Atomic force microscope
    • G. Binnig, and C.F. Quate Atomic force microscope Phys Rev Lett 56 9 1986 930 933
    • (1986) Phys Rev Lett , vol.56 , Issue.9 , pp. 930-933
    • Binnig, G.1    Quate, C.F.2
  • 4
    • 12144290263 scopus 로고    scopus 로고
    • Nonlinear dynamics of atomic-force-microscope probes driven in Lennard-Jones potentials
    • S. Rützel, S.I. Lee, and A. Raman Nonlinear dynamics of atomic-force-microscope probes driven in Lennard-Jones potentials Proc R Soc London A 459 2003 1925 1948
    • (2003) Proc R Soc London A , vol.459 , pp. 1925-1948
    • Rützel, S.1    Lee, S.I.2    Raman, A.3
  • 5
    • 36449007507 scopus 로고
    • Parallel beam approximation for V-shaped atomic force microscope cantilevers
    • J.E. Sader Parallel beam approximation for V-shaped atomic force microscope cantilevers Rev Sci Instrum 66 9 1995 4583 4587
    • (1995) Rev Sci Instrum , vol.66 , Issue.9 , pp. 4583-4587
    • Sader, J.E.1
  • 6
    • 0038341801 scopus 로고    scopus 로고
    • Susceptibility of atomic force microscope cantilevers to lateral forces
    • J.E. Sader, and C.P. Green Susceptibility of atomic force microscope cantilevers to lateral forces Rev Sci Instrum 74 2003 2438 2443
    • (2003) Rev Sci Instrum , vol.74 , pp. 2438-2443
    • Sader, J.E.1    Green, C.P.2
  • 7
    • 2042543448 scopus 로고    scopus 로고
    • In-plane deformation of cantilever plates with applications to lateral force microscopy
    • J.E. Sader, and C.P. Green In-plane deformation of cantilever plates with applications to lateral force microscopy Rev Sci Instrum 75 4 2004 878 883
    • (2004) Rev Sci Instrum , vol.75 , Issue.4 , pp. 878-883
    • Sader, J.E.1    Green, C.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.