Equilibrium and stability of micro-cantilevers used in atomic force microscopy

Proceedings - 2004 International Conference on MEMS, NANO and Smart Systems, ICMENS 2004

Volumn , Issue , 2004, Pages 537-540

  Zu, Jean W ^a   Cheng, Gong ^a   Tang, Qian ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIFURCATION (MATHEMATICS); COMPUTER SIMULATION; PARAMETER ESTIMATION; PHASE EQUILIBRIA; PRODUCT DESIGN;

CONTACT MODE OPERATIONS; MASSLESS SPHERE TIP; MICRO-CANTILEVERS; SAMPLE SURFACE;

CANTILEVER BEAMS;

EID: 16244362742     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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2. J.A. Turner, S. Hirsekorn, U. Rabe and W. Arnold, "High-frequency response of atomic-force microscope cantilevers", 1997, Journal of Applied Physics, 82: pp. 966-979.
3. M. Ashhab, M.V. Salapaka, M. Dahleh and I. Mezic, "Dynamical analysis and control of microcantilevers", 1999, Automatica, 35: pp. 1663-1670.
4. R.-F. Fung and S.-C. Huang, "Dynamic modeling and vibration analysis of the atomic force microscope", 2001, ASME Journal of Vibration and Acoustics, 123: pp. 502-509.
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6. J.A. Turner, "Nonlinear vibrations in contact atomic force microscopy", ASME 2003 Design Engineering Technical Conferences and Computers and Information in Engineering Conference, Chicago, Illinois, USA, September 2-6, 2003.
7. J.N. Israelachvili, Intermolecular and Surface Forces, Academic Press, 1991.